|Category||Interface and Interconnect => Transceivers|
|Description||Fast CMOS Octal Bidirectional Transceivers|
|Company||Integrated Device Technology, Inc.|
|Datasheet||Download IDT54FCT640DTE datasheet
IDT54/74FCT245/640/645 equivalent to FASTTM speed and drive IDT54/74FCT245A/640A/645A 25% faster than FAST IDT54/74FCT245C/640C/645C 40% faster than FAST TTL input and output level compatible CMOS output level compatible IOL = 64mA (commercial) and 48mA (military) Input current levels only 5µA max. CMOS power levels (2.5mW typical static) Direction control and over-riding 3-state control Product available in Radiation Tolerant and Radiation Enhanced versions Military product compliant to MIL-STD-883, Class B and DESC listed Meets or exceeds JEDEC Standard 18 specifications
The IDT octal bidirectional transceivers are built using an advanced dual metal CMOS technology. The 74FCT245/A/C, IDT54/74FCT640/A/C and IDT54/74FCT645/ A/C are designed for asynchronous two-way communication between data buses. The transmit/receive (T/R) input determines the direction of data flow through the bidirectional transceiver. Transmit (active HIGH) enables data from A ports to B ports, and receive (active LOW) from B ports to A ports. The output enable (OE) input, when HIGH, disables both A and B ports by placing them in High-Z condition. The IDT54/74FCT245/A/C and IDT54/74FCT645/A/C transceivers have non-inverting outputs. The IDT54/ 74FCT640/A/C has inverting outputs.
The IDT logo is a registered trademark of Integrated Device Technology, Inc. FAST is a registered trademark of National Semiconductor Co.
Pin Names Description Output Enable Input (Active LOW) Transmit/Receive Input Side A Inputs or 3-State Outputs Side B Inputs or 3-State Outputs
NOTES: 640 is inverting from input to output. H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care
Symbol Rating VTERM(2) Terminal Voltage with Respect to GND VTERM(3) Terminal Voltage with Respect to GND TA Operating Temperature TBIAS Temperature Under Bias TSTG Storage Temperature PT Power Dissipation DC Output Current IOUT Commercial to +7.0 Military Unit +7.0 V
Symbol CIN CI/O Parameter(1) Input Capacitance I/O Capacitance Conditions VIN = 0V VOUT = 0V Typ. Max. Unit pFNOTE: 2534 1. This parameter is measured at characterization but not tested.
NOTES: 2534 tbl 01 Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +0.5V unless otherwise noted. 2. Inputs and VCC terminals. 3. Outputs and I/O terminals.
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC 0.2V Commercial: to +70°C, VCC ± 5%; Military: to +125°C, VCC ± 10%
Symbol VIH VIL IIH IIL IIH IIL VIK IOS VOH Parameter Input HIGH Level Input LOW Level Input HIGH Current (Except I/O pins) Input LOW Current (Except I/O pins) Input HIGH Current (I/O pins only) Input LOW Current (I/O pins only) Clamp Diode Voltage Short Circuit Current Output HIGH Voltage VCC = Min., = 18mA VCC = Max. VO = GND VCC = 3V, VIN = VLC or VHC, IOH = 32µA VCC = Min. VIN = VIH or VIL VOL Output LOW Voltage (Port A and Port B) IOH = 300µA IOH = 12mA MIL. IOH = 15mA COM'L. VCC = 3V, VIN = VLC or VHC, IOL = 300µA VCC = Min. VIN = VIH or VIL IOL = 300µA IOL = 48mA MIL. IOL = 64mA COM'L.
Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max VI = VCC VI = GND VI = VCC VI = GND
NOTES: 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC 5.0V, +25°C ambient and maximum loading. 3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second. 4. This parameter is guaranteed but not tested.
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