Details, datasheet, quote on part number: IDT54FCT574ATQ
CategoryLogic => Registers => CMOS/BiCMOS->FCT/FCT-T Family
DescriptionFast CMOS Octal D Registers (3-state)
CompanyIntegrated Device Technology, Inc.
DatasheetDownload IDT54FCT574ATQ datasheet


Features, Applications

IDT54FCT574A equivalent to FASTTM speed and drive to 30% faster than FAST to 50% faster than FAST IOL = 48mA (commercial) and 32mA (military) CMOS power levels (1mW typ. static) Edge-triggered master/slave, D-type flip-flops Buffered common clock and buffered common 3-state control MIlitary product compliant to MIL-STD-883, Class B Meets or exceeds JEDEC Standard 18 specifications Available in the following packages: Commercial: SOIC Military: CERDIP, LCC

The an 8-bit register built using an advanced dual metal CMOS technology. These registers consist of eight D-type flip-flops with a buffered common clock and buffered 3-state output control. When the output enable (OE) is low, the eight outputs are enabled. When the OE input is high, the outputs are in the high-impedance state. Input data meeting the set-up and hold time requirements of the D inputs is transferred to the O outputs on the low-to-high transition of the clock input. The FCT574 has non-inverting outputs with respect to the data at the D inputs.

The IDT logo is a registered trademark of Integrated Device Technology, Inc.

Symbol VTERM(3) TA TBIAS TSTG PT IOUT Rating Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Operating Temperature under BIAS Storage Temperature Power Dissipation DC Output Current 0.5 to VCC 0.5 to VCC V Commercial to +7 Military to +7 Unit V

Pin Names Ox OE Description D flip-flop data inputs Clock Pulse for the register. Enters data on LOW-toHIGH transition. 3-State Outputs (TRUE) Active LOW 3-State Output Enable Input

Function High-Z Load Register OE Inputs H Dx Outputs Ox Internal Ox NC

NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed Vcc by +0.5V unless otherwise noted. 2. Input and Vcc terminals only. 3. Output and I/O terminals only.

Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 6 8 Max. 10 12 Unit pF

NOTE: H = HIGH Voltage Level X = Don't Care L = LOW Voltage Level Z = High Impedance = No Change = LOW-to-HIGH transition

NOTE: 1. This parameter is measured at characterization but not tested.

Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC - 0.2V Commercial: to +70C, VCC 5.0V 5%, Military: to +125C, VCC 5.0V 10%

Symbol VIH VIL IIH IIL IOZH IOZL VIK IOS VOH Off State (High Impedance) Output Current Clamp Diode Voltage Short Circuit Current Output HIGH Voltage VCC = Max. Parameter Input HIGH Level Input LOW Level Input HIGH Current VCC = Max. Input LOW Current Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VI = VCC VI = GND VO = VCC VO = GND GND(3) Min. 2 60 VHC 0.7 120 VCC 4.3 GND 0.3 Max. VLC 0.5 A Unit V

VCC = Min., IIN = 18mA VCC = Max., VO = VCC = 3V, VIN = VLC or VHC, IOH = 32A VCC = Min IOH = 300A VIN = VIH or VIL IOH = 12mA MIL IOH = 15mA COM'L VCC = 3V, VIN = VLC or VHC, IOL = 300A VCC = Min IOL = 300A VIN = VIH or VIL IOL = 32mA MIL IOL = 48mA COM'L

NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC 5.0V, +25C ambient and maximum loading. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. This parameter is guaranteed but not ttested.


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0-C     D-L     M-R     S-Z